Sökning: "Cf-252"

Hittade 4 avhandlingar innehållade ordet Cf-252.

  1. 1. Neutron Irradiation Techniques

    Författare :Julius Scherzinger; Kärnfysik; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; actinide Be; fast-neutrons; NE-213 liquid scintillator; He-4 scintillators; pulse-shape discrimination; Cf-252; absolute detection efficiency; neutron irradiation; Fysicumarkivet A:2016:Scherzinger;

    Sammanfattning : The He-3 “crisis” has become a fact in the last decade and large scale neutron detectors based on He-3 technologies have become unaffordable. This new He-3 reality has resulted in a major effort worldwide to develop replacement neutron-detector technologies. LÄS MER

  2. 2. Neutron Multiplicity Counting with the Analysis of Continuous Detector Signals

    Författare :Lajos Nagy; Chalmers tekniska högskola; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; Kolmogorov equation; fissile material assay; nuclear safeguards; fission chamber; neutron multiplicity counting; master equation;

    Sammanfattning : Neutron multiplicity counting is a non-destructive assay method for determining the mass of fissile materials (primarily plutonium) using the measured values of the singles, doubles and triples detection rates. Traditionally, the detection rates are obtained from the counting statistics of neutron detectors. LÄS MER

  3. 3. Multiple-Bit Errors in Computer Systems

    Författare :Rolf Johansson; Chalmers tekniska högskola; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES; fault sim ulation; fault tolerance; single event upsets; error-correcting codes; multiple-bit errors; transient faults; fault modelling; physical fault injection;

    Sammanfattning : This thesis discusses the types of transient faults caused by heavy-ion or a-particle radiation that manifest as multiple-bit errors and how information redundancy techniques can achieve fault tolerance with respect to some classes of multiple-bit errors. The first part of the thesis considers the fault modelling problem, beginning with the problem of how single event upsets (SEUs) originating from faults in register cells in microprocessors manifest as primary errors. LÄS MER

  4. 4. Fault Simulation and Physical Fault Injection Applied to MOS Transistor Networks

    Författare :Peter Lidén; Chalmers tekniska högskola; []
    Nyckelord :NATURVETENSKAP; NATURAL SCIENCES;

    Sammanfattning : Detailed information on a system's behavior in the presence of faults is often vital. It may be used to grade or construct tests for the efficient detection of faults or to increase confidence in high-reliable systems. LÄS MER