Sökning: "scanning tunneling microscopy spectroscopy"
Visar resultat 1 - 5 av 51 avhandlingar innehållade orden scanning tunneling microscopy spectroscopy.
1. Electronic and Geometrical Structure of Phthalocyanines on Surfaces : An Electron Spectroscopy and Scanning Tunneling Microscopy Study
Sammanfattning : Core- and Valence Photoelectron Spectroscopy (PES), X-ray- and Ultraviolet-Visible Absorption Spectroscopy (XAS and UV-Vis), Scanning Tunneling Microscopy (STM) and Density Functional Theory (DFT) calculations are used to study the electronic and geometrical structure of a class of macro-cyclic molecules, Phthalocyanines (Pc), on surfaces. These molecules are widely studied due to their application in many different fields. LÄS MER
2. Scanning Tunneling Microscopy Induced Luminescence Studies of Semiconductor Nanostructures
Sammanfattning : This thesis treats scanning tunneling luminescence (STL) investigations of semiconductor nanostructures. The STL technique combines scanning tunneling microscopy (STM) with detection of photons, induced by the tunneling electrons. The high spatial resolution in STM and the local excitation allow for optical investigations on the nanometer-scale. LÄS MER
3. The Cu(111) surface studied by scanning tunnelling microscopy and spectroscopy
Sammanfattning : .... LÄS MER
4. Transmission Electron Microscopy of Semiconductor Nanowires
Sammanfattning : Semiconductor nanowires are studied by using transmission electron microscopy (TEM) based methods in this work. In the first section, the growth mechanism of gallium arsenide nanowires grown by chemical beam epitaxy is investigated. The nanowires are epitaxially grown from a gallium arsenide substrate by using gold seed particles as catalysts. LÄS MER
5. III–V Nanowire Surfaces
Sammanfattning : This dissertation deals with the geometric and electronic structure of surfaces on III–V semiconductor nanowires (NWs). NWs made of InAs, GaAs, and InP have been studied using scanning tunneling microscopy/spectroscopy (STM/S), low energy electron microscopy (LEEM), photoemission electron microscopy (PEEM), and x-ray photoelectron spectroscopy (XPS). LÄS MER