Sökning: "edge overheating"

Hittade 3 avhandlingar innehållade orden edge overheating.

  1. 1. Analysis of Industrial Microwave Ovens

    Författare :Magnus Sundberg; Chalmers tekniska högskola; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; source model; heat transfer; moment method; finite difference time domain; TM applicator; GMT; edge diffraction; thermal simulation; MMP; FDTD; generalized multipole technique; cost function; MM; optimization; magnetron; simulated annealing; multiple multipole program; microwave heating; edge overheating; TE applicator; tunnel-oven; applicator;

    Sammanfattning : This thesis deals with the analysis and design of microwave ovens used in the food industry. Such analysis is desirable in order to optimize the performance of the ovens and to reduce the time and expenses of developing new or improved ovens. LÄS MER

  3. 2. Machine learning based control of small-scale autonomous data centers

    Författare :Rickard Brännvall; Fredrik Sandin; Jonas Gustafsson; Johan Eker; Luleå tekniska universitet; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Reglerteknik; Control Engineering;

    Sammanfattning : The low-latency requirements of 5G are expected to increase the demand for distributeddata storage and computing capabilities in the form of small-scale data centers (DC)located at the edge, near the interface between mobile and wired networks. These edgeDC will likely be of modular and standardized designs, although configurations, localresource constraints, environments and load profiles will vary and thereby increase theDC infrastructure diversity. LÄS MER

  4. 3. Thermal Issues in Testing of Advanced Systems on Chip

    Författare :Nima Aghaee Ghaleshahi; Zebo Peng; Petru Eles; Jaan Raik; Linköpings universitet; []
    Nyckelord :TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SoC test; test scheduling; Adaptive test; Temperature awareness; Process variation; Thermal simulation; 3D stacked IC 3DSIC test; Burn-in; Temperature gradients; Temperature Cycling Test; Test Ordering;

    Sammanfattning : Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. LÄS MER