Sökning: "Tungsten oxide"
Visar resultat 1 - 5 av 35 avhandlingar innehållade orden Tungsten oxide.
1. Electrochromic Nickel – Tungsten Oxides : Optical, Electrochemical and Structural Characterization of Sputter-deposited Thin Films in the Whole Composition Range
Sammanfattning : This thesis investigates the electrochromic NixW1-x oxide thin film system, where 0 < x < 1. The thin films were deposited by reactive DC magnetron co-sputtering from one Ni and one W metal target. In addition, Ni oxide was deposited with water vapor added to the sputtering gas. LÄS MER
2. Development of Nanostructured Tungsten Based Composites for Energy Applications
Sammanfattning : Tungsten (W) based materials can be used in fusion reactors due to several advantages. Different fabrication routes can be applied to develop tungsten materials with intended microstructure and properties for specific application including nanostructured grades. LÄS MER
3. Electrochromic materials : optical, electrophysical and structural properties
Sammanfattning : .... LÄS MER
4. Dynamic and quasi-stationary electrochromic response of amorphous tungsten oxide thin films : In situ combined electrochemical and optical measurements during lithium intercalation
Sammanfattning : Electrochromic (EC) materials can adjust their optical properties, reversibly, by means of an external electrical stimulus. They have relevant technological applications; for example, energy-efficient smart windows, which can adapt dynamically—according to the given environmental conditions—to control the heat and visible light fluxes between the interior and exterior of a building. LÄS MER
5. Optical Absorption and Electrical Conductivity in Lithium Intercalated Amorphous Tungsten Oxide Films
Sammanfattning : Optical and electrical properties of electrochemically lithium ion intercalated thin films of x-ray amorphous tungsten oxide made by magnetron sputtering on glass substrates coated with a thin layer of conductive tin doped indium oxide, have been studied. The composition and the density of the films were characterized by the ion beam analysis methods Rutherford Backscattering Spectroscopy and Elastic Recoil Detection Analysis. LÄS MER