Sökning: "AuGe GaAs"
Hittade 3 avhandlingar innehållade orden AuGe GaAs.
1. Atom-probe microanalysis of the AuGe/GaAs interface
Sammanfattning : .... LÄS MER
2. Atom-Probe Field-Ion Microscopy of Electronic Materials
Sammanfattning : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. LÄS MER
3. Atom Probe Field Ion Microscopy of Surface Zones, Coatings and Interfaces
Sammanfattning : This thesis is focused on developingmethods for high resolution microanalysis of coatings on a substrate, andsurface zones of a bulk sample using atom probe field ion microscopy,APFIM. The APFIM technique is described and some examples of its applications to semiconductors,cemented carbides and intermetallic compounds are given. LÄS MER