Sökning: "3D stacked IC 3DSIC test"
Hittade 1 avhandling innehållade orden 3D stacked IC 3DSIC test.
1. Thermal Issues in Testing of Advanced Systems on Chip
Sammanfattning : Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. LÄS MER
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